Timezone: »

OOD-MAML: Meta-Learning for Few-Shot Out-of-Distribution Detection and Classification
Taewon Jeong · Heeyoung Kim

Wed Dec 09 09:00 PM -- 11:00 PM (PST) @ Poster Session 4 #1212

We propose a few-shot learning method for detecting out-of-distribution (OOD) samples from classes that are unseen during training while classifying samples from seen classes using only a few labeled examples. For detecting unseen classes while generalizing to new samples of known classes, we synthesize fake samples, i.e., OOD samples, but that resemble in-distribution samples, and use them along with real samples. Our approach is based on an extension of model-agnostic meta learning (MAML) and is denoted as OOD-MAML, which not only learns a model initialization but also the initial fake samples across tasks. The learned initial fake samples can be used to quickly adapt to new tasks to form task-specific fake samples with only one or a few gradient update steps using MAML. For testing, OOD-MAML converts a K-shot N-way classification task into N sub-tasks of K-shot OOD detection with respect to each class. The joint analysis of N sub-tasks facilitates simultaneous classification and OOD detection and, furthermore, offers an advantage, in that it does not require re-training when the number of classes for a test task differs from that for training tasks; it is sufficient to simply assume as many sub-tasks as the number of classes for the test task. We also demonstrate the effective performance of OOD-MAML over benchmark datasets.

Author Information

Taewon Jeong (KAIST)
Heeyoung Kim (KAIST)

More from the Same Authors