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Poster
Positive-Unlabeled Learning with Non-Negative Risk Estimator
Ryuichi Kiryo · Gang Niu · Marthinus C du Plessis · Masashi Sugiyama

Tue Dec 05 06:30 PM -- 10:30 PM (PST) @ Pacific Ballroom #15 #None

From only positive (P) and unlabeled (U) data, a binary classifier could be trained with PU learning, in which the state of the art is unbiased PU learning. However, if its model is very flexible, empirical risks on training data will go negative, and we will suffer from serious overfitting. In this paper, we propose a non-negative risk estimator for PU learning: when getting minimized, it is more robust against overfitting, and thus we are able to use very flexible models (such as deep neural networks) given limited P data. Moreover, we analyze the bias, consistency, and mean-squared-error reduction of the proposed risk estimator, and bound the estimation error of the resulting empirical risk minimizer. Experiments demonstrate that our risk estimator fixes the overfitting problem of its unbiased counterparts.

Author Information

Ryuichi Kiryo (UTokyo/RIKEN)
Gang Niu (RIKEN)

Gang Niu is currently a research scientist (indefinite-term) at RIKEN Center for Advanced Intelligence Project. He received the PhD degree in computer science from Tokyo Institute of Technology in 2013. Before joining RIKEN as a research scientist, he was a senior software engineer at Baidu and then an assistant professor at the University of Tokyo. He has published more than 70 journal articles and conference papers, including 14 NeurIPS (1 oral and 3 spotlights), 28 ICML, and 2 ICLR (1 oral) papers. He has served as an area chair 14 times, including ICML 2019--2021, NeurIPS 2019--2021, and ICLR 2021--2022.

Marthinus C du Plessis (The University of Tokyo)
Masashi Sugiyama (RIKEN / University of Tokyo)

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