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Poster
Correlated random features for fast semi-supervised learning
Brian McWilliams · David Balduzzi · Joachim M Buhmann

Thu Dec 05 07:00 PM -- 11:59 PM (PST) @ Harrah's Special Events Center, 2nd Floor
in Poster Session »

This paper presents Correlated Nystrom Views (XNV), a fast semi-supervised algorithm for regression and classification. The algorithm draws on two main ideas. First, it generates two views consisting of computationally inexpensive random features. Second, multiview regression, using Canonical Correlation Analysis (CCA) on unlabeled data, biases the regression towards useful features. It has been shown that CCA regression can substantially reduce variance with a minimal increase in bias if the views contains accurate estimators. Recent theoretical and empirical work shows that regression with random features closely approximates kernel regression, implying that the accuracy requirement holds for random views. We show that XNV consistently outperforms a state-of-the-art algorithm for semi-supervised learning: substantially improving predictive performance and reducing the variability of performance on a wide variety of real-world datasets, whilst also reducing runtime by orders of magnitude.

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Author Information

Brian McWilliams (DeepMind)
David Balduzzi (Victoria University Wellington)
Joachim M Buhmann (ETH Zurich)

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